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IEEE15h
State-of-the-Art Techniques for Detecting Transient Errors in Electrical Circuits - IEEE Xplore
Sign Out ADVANCED SEARCH Journals & Magazines > IEEE Potentials > Volume: 30 Issue: 3 State-of-the-Art Techniques for Detecting Transient Errors in Electrical Circuits Publisher: IEEE Cite This PDF ...
IEEE14h
Electrical-thermal co-analysis of through silicon via with equivalent circuit model - IEEE Xplore
An electrical-thermal co-analysis method for through silicon via using equivalent circuit model is proposed in this paper. The electrical part is based on analytical methods, taking physical effects ...